Instrument name |
Probe Station |
Model |
M150 |
Manufacturer |
Cascade Microtech. Inc. |
Specifications |
1.Wafer Chuck: Up to 4 inch 2.Temperature Control: From 25℃to 300℃ 3. Amplification of Microscope: Optical 400 times 4. Leakage Current: ≤50 fA |
Function and applications |
The probe station is widely used in the field of I-V/C-V measurments, device characterization, submicron probing, optoelectronic engineering tests and more. |
Accessories |
Shock-absorbing Bracket |
Contacts: Wenchang Zhu |
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Contact number:65881259 |
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E-mail: wczhu@suda.edu.cn |
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Editor: Wenchang Zhu